Performance Monitoring of 32 Bit Microcontroller System Prone to ESD
Low cost, microcontroller-based embedded applications are particularly susceptible to performance degradation during ESD and EFT events. This sensitivity is due to process technologies employed where microcontrollers (MCU) implement transistor gate lengths which are capable of generating and responding to signals with rise times in the sub-nanosecond range (or an equivalent bandwidth of greater than 300 MHz). As a result, an MCU is quite capable of responding to ESD or EFT signals injected onto its pins.
Ross Carlton, Greg Racino, John Suchyta, “Improving the Transient Immunity Performance of Microcontroller-Based Applications”, Freescale Semiconductor Application Note, AN2764, Rev. 0, 06/2005. www.freescale.com/files/microcontrollers/doc/app.../AN2764.pdfJ
Lijun Han, Jayong Koo, David Pommerenke, Daryl Beetner and Ross Carlton, “Experimental Investigation of the ESD Sensitivity of an 8-Bit Microcontroller”, 1-4244-1350-8/07©2007 IEEEX-plore.
T.C. Lun, "Designing for Board Level Electromagnetic Compatibility", Motorola Application Note (AN) 2321.
Cyril Troise - Microcontroller Division Applications, “EMC design guide for ST microcontrollers” AN1709 application note. www.st.com/internet/com/TECHNICAL.../CD00004479.pdf
IEC 61000-4-4, Electromagnetic Compatibility (EMC) - Part 4-4: Testing and measurement techniques - Electrical fast transient/burst immunity test, International Electrotechnical Commission, 2001.
IEC 61000-4-2, Electromagnetic compatibility (EMC) - Part 4-2: Testing and measurement techniques - Electrostatic discharge immunity test, International Electrotechnical Commission, 2001.
Ming Dou Ker and YuYu Sang, “Hardware_firmware co-design in an 8-bits microcontroller to solve the system-level ESD issue on keyboard”, Microelectronics Reliability, (41), 2001, pp 417-429.
Ronald B. Standler, Protection of Electronic Circuits from Overvoltages, John Wiley & Sons, 1989, pp. 265-283.
Ken Kundert, "Power Supply Noise Reduction", The Designer's Guide , 2004.
Larry D. Smith, "Decoupling Capacitor Calculations for CMOS Circuits", Electrical Performance of Electrical Packages Conference, Monterey CA, November 1994, Pages 101-105.
Clayton Paul, Introduction to Electromagnetic Compatibility, Wiley & Sons, 1992.
Bernard Keiser, Principles of Electromagnetic Compatibility, Artech House, 1987.
Besse P., Abouda K., Abouda C., “Identifying electrical mechanisms responsible for functional failures during harsh external ESD and EMC aggression”, Microelectronics Reliability, 51 (9-11), p.1597-1601, Sep 2011.
R.A. Ashton, "System Level ESD Testing: The Test Setup," Conformity, December 2007, pg 34.